The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 03, 2017
Filed:
Apr. 17, 2015
Applicant:
Picarro Inc., Santa Clara, CA (US);
Inventors:
Chris W. Rella, Sunnyvale, CA (US);
Sze M. Tan, Sunnyvale, CA (US);
Yonggang He, Union City, CA (US);
Assignee:
Picarro, Inc., Santa Clara, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/42 (2006.01); G01J 3/12 (2006.01); G01J 3/06 (2006.01); G01J 3/02 (2006.01); G01J 3/28 (2006.01);
U.S. Cl.
CPC ...
G01J 3/42 (2013.01); G01J 3/0275 (2013.01); G01J 3/06 (2013.01); G01J 2003/2853 (2013.01); G01J 2003/2859 (2013.01); G01J 2003/423 (2013.01);
Abstract
Described self-referencing cavity enhanced spectroscopy (SRCES) systems and methods are tailored to acquiring spectra in a middle regime, in which signals are lower than optimal for conventional absorption spectroscopy, and absorption is higher than optimal for cavity ring-down spectroscopy (CRDS). Longitudinal mode resonance spectral peaks are analyzed individually to extract intensity ratios (e.g. maximum to minimum) and/or curve-fitting parameters, obviating the need to measure or precisely control the input light intensity.