The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 26, 2017
Filed:
Mar. 14, 2016
Xilinx, Inc., San Jose, CA (US);
Sabyasachi Das, San Jose, CA (US);
Zhiyong Wang, Cupertino, CA (US);
XILINX, INC., San Jose, CA (US);
Abstract
Aspects of processing a circuit design include synthesizing the circuit design and placing elements of the synthesized circuit design. After placing and before routing, respective delay values and slacks are determined. A first path having a most negative slack is determined and a first group of candidate paths is selected. The first group of candidate paths is a subset of critical paths of the circuit design, and the first group of candidate paths have delay values within a threshold range of delay values from the delay value of the first path. The first group of candidate paths are modified to reduce the respective delay values and a second group of candidate paths is selected. The second group of candidate paths have circuit structures that match selected circuit structures and are modified to reduce the respective delay values. A critical path having a most negative slack is iteratively selected and modified to reduce the respective delay value.