The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 26, 2017

Filed:

Sep. 24, 2013
Applicants:

International Business Machines Corporation, Armonk, NY (US);

Jsr Corporation, Tokyo, JP;

Inventors:

Ramakrishnan Ayothi, San Jose, CA (US);

Sally A. Swanson, San Jose, CA (US);

Gregory M. Wallraff, San Jose, CA (US);

Assignees:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G03F 7/32 (2006.01); G03F 7/20 (2006.01); G03F 7/40 (2006.01); G03F 7/004 (2006.01); G03F 7/039 (2006.01); G03F 7/038 (2006.01);
U.S. Cl.
CPC ...
G03F 7/325 (2013.01); G03F 7/0045 (2013.01); G03F 7/0046 (2013.01); G03F 7/0048 (2013.01); G03F 7/0382 (2013.01); G03F 7/0392 (2013.01); G03F 7/0397 (2013.01); G03F 7/2037 (2013.01); G03F 7/2041 (2013.01); G03F 7/40 (2013.01);
Abstract

Provided are chemically amplified resist compositions that include acid-labile sulfonate-ester photoresist polymers that are developable in an organic solvent. The chemically amplified resists produce high resolution positive tone development (PTD) and negative tone development (NTD) images depending on the selection of organic development solvent. Furthermore, the dissolution contrast of the traditional chemically amplified resists may be optimized for dual tone imaging through the addition of a photoresist polymer comprising an acid-labile sulfonate-ester moiety.


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