The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 26, 2017
Filed:
May. 17, 2012
Akihiro Yasui, Tokyo, JP;
Kazuhiro Nakamura, Tokyo, JP;
Hitoshi Tokieda, Tokyo, JP;
Hitachi High-Technologies Corporation, Tokyo, JP;
Abstract
An automatic analyzer is capable of controlling the gap between the tip of the sample nozzle and the bottom surface of the reaction container and restricting the sample attached to the tip of the sample nozzle. A movement distance of an arm is calculated and stored while the tip of the sample nozzle contacts a coordinate measurement stand until a stop position detector detects a stop position detection plate. The sample nozzle is moved toward the bottom surface of the reaction container and is stopped at the time when the stop position detector detects the stop position detection plate. The arm is moved upwardly for the movement distance stored in memory from this position. The sample nozzle can be stopped such that the tip of the sample nozzle is contacted to the bottom surface of the reaction container and the bend (warp) of the sample nozzle is restricted.