The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 26, 2017

Filed:

Mar. 18, 2014
Applicant:

Stratasys, Inc., Eden Prairie, MN (US);

Inventors:

James W. Comb, Hamel, MN (US);

Zeiter S. Farah, Minneapolis, MN (US);

J. Samuel Batchelder, Somers, NY (US);

Assignee:

Stratasys, Inc., Eden Prairie, MN (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
B29C 67/00 (2017.01); G03G 15/22 (2006.01); B33Y 10/00 (2015.01); B33Y 30/00 (2015.01); B33Y 50/02 (2015.01);
U.S. Cl.
CPC ...
B29C 67/0088 (2013.01); B29C 67/0055 (2013.01); G03G 15/224 (2013.01); B33Y 10/00 (2014.12); B33Y 30/00 (2014.12); B33Y 50/02 (2014.12);
Abstract

A method and system for printing a three-dimensional part, which includes printing a plurality of successive layers of the three-dimensional part with the additive manufacturing system based on bitslices in a bitslice stack, measuring surface heights of the successive layers after each of the successive layers are printed, determining differences between the measured surface heights and predicted stack heights of the bitslices, identifying one or more topographical error regions based on the determined differences, and modifying the bitslice stack to compensate for the one or more topographical error regions.


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