The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 9768316 B1

PDF
Full Text
Expired
Date of Patent:
Sep. 19, 2017

Filed:

Jul. 16, 2014
Applicant:

Sumitomo Metal Mining Co., Ltd., Tokyo, JP;

Inventors:

Tokuyuki Nakayama, Tokyo, JP;

Eiichiro Nishimura, Tokyo, JP;

Masashi Iwara, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 27/12 (2006.01); H01L 29/786 (2006.01); C23C 14/08 (2006.01); H01L 21/02 (2006.01); C23C 14/34 (2006.01);
U.S. Cl.
CPC ...
H01L 29/7869 (2013.01); C23C 14/08 (2013.01); C23C 14/3414 (2013.01); H01L 21/02565 (2013.01); H01L 21/02631 (2013.01); H01L 27/1225 (2013.01); H01L 27/1285 (2013.01); H01L 29/78696 (2013.01);
Abstract

Provided is a crystalline oxide semiconductor thin film comprising only bixbyite-structured InOphase, suitable as a channel layer material for a thin film transistor, and having excellent etching properties in an amorphous state and a low carrier density and high carrier mobility in a crystalline state. An amorphous oxide thin film is formed using, as a target, an oxide sintered body which comprises indium, gallium, oxygen, and unavoidable impurities, the gallium content being in a range of 0.09 to 0.45 in terms of a Ga/(In+Ga) atomic ratio, has a InOphase having a bixbyite structure as the main crystal phase, and has a GaInOphase having a β-GaO-type structure, or a GaInOphase having a β-GaO-type structure and a (Ga, In)Ophase finely dispersed therein. The amorphous oxide thin film is finely processed by performing etching using photolithography, and is annealed.


Find Patent Forward Citations

Nakayama, Tokuyuki. (2017). Oxide semiconductor thin film and thin film transistor (U.S. Patent No. 9768316). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9768316

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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