The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 9762378 B1

PDF
Full Text
Expired
Date of Patent:
Sep. 12, 2017

Filed:

Jun. 28, 2016
Applicant:

Cadence Design Systems, Inc., San Jose, CA (US);

Inventor:

Mark Alan Summers, Cary, NC (US);

Assignee:

Cadence Design Systems, Inc., San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 7/00 (2006.01); H04B 10/61 (2013.01); H04L 27/14 (2006.01);
U.S. Cl.
CPC ...
H04L 7/0008 (2013.01); H04B 10/6165 (2013.01); H04L 27/14 (2013.01);
Abstract

A phase difference multiplier circuit is disclosed that includes first and second delay circuits to apply two different quantities of delay to first and second input signals. The first and second delay circuits may operate in a first mode where a first and smaller amount of delay is imparted to the respective input signals. The first and second input signals differ in phase, and a transition in the first signal will be followed by a similar transition in the second signal. Following the transition of the first signal reaching the input of the first delay circuit, the similar transition will reach the input of the second delay circuit. In response to the transition reaching the input of the second delay circuit, the first and second delay circuits are then operated to impart a second and larger amount of delay to the first and second signals. At the output of the first and second delay circuits, the duration of the difference in phase between the first and second signals is increased by a multiplication factor. Extending the duration in such a manner may, for example, make the initial difference in phase easier to measure.


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