The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 12, 2017

Filed:

Mar. 11, 2013
Applicants:

Yimin Kang, San Jose, CA (US);

Han-din D. Liu, San Jose, CA (US);

Ansheng Liu, Cupertino, CA (US);

Inventors:

Yimin Kang, San Jose, CA (US);

Han-Din D. Liu, San Jose, CA (US);

Ansheng Liu, Cupertino, CA (US);

Assignee:

Intel Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01S 5/02 (2006.01); H01L 31/107 (2006.01); H01L 31/028 (2006.01); H01L 31/0232 (2014.01); G02B 6/26 (2006.01); H01L 35/24 (2006.01); G02B 6/12 (2006.01); H01L 31/105 (2006.01); H01L 31/18 (2006.01);
U.S. Cl.
CPC ...
H01L 31/028 (2013.01); H01L 31/02327 (2013.01); H01L 31/105 (2013.01); H01L 31/107 (2013.01); H01L 31/1804 (2013.01); Y02E 10/547 (2013.01);
Abstract

A low voltage APD is disposed at an end of a waveguide extending laterally within a silicon device layer of a PIC chip. The APD is disposed over an inverted re-entrant mirror co-located at the end of the waveguide to couple light by internal reflection from the waveguide to an under side of the APD. In exemplary embodiments, a 45°-55° facet is formed in the silicon device layer by crystallographic etch. In embodiments, the APD includes a silicon multiplication layer, a germanium absorption layer over the multiplication layer, and a plurality of ohmic contacts disposed over the absorption layer. An overlying optically reflective metal film interconnects the plurality of ohmic contacts and returns light transmitted around the ohmic contacts to the absorption layer for greater detector responsivity.


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