The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 12, 2017
Filed:
Sep. 30, 2016
Hampton Creek, Inc., San Francisco, CA (US);
Lee Chae, San Francisco, CA (US);
Josh Stephen Tetrick, San Francisco, CA (US);
Meng Xu, San Francisco, CA (US);
Matthew D. Schultz, San Francisco, CA (US);
Chuan Wang, San Francisco, CA (US);
Nicolas Tilmans, San Francisco, CA (US);
Michael Brzustowicz, San Francisco, CA (US);
Hampton Creek, Inc., San Francisco, CA (US);
Abstract
Systems and methods for assaying a test entity for a property, without measuring the property, are provided. Exemplary test entities include proteins, protein mixtures, and protein fragments. Measurements of first features in a respective subset of an N-dimensional space and of second features in a respective subset of an M-dimensional space, is obtained as training data for each reference in a plurality of reference entities. One or more of the second features is a metric for the target property. A subset of first features, or combinations thereof, is identified using feature selection. A model is trained on the subset of first features using the training data. Measurement values for the subset of first features for the test entity are applied to thereby obtaining a model value that is compared to model values obtained using measured values of the subset of first features from reference entities exhibiting the property.