The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 12, 2017

Filed:

Apr. 29, 2014
Applicant:

Electronics and Telecommunications Research Institute, Daejeon, KR;

Inventors:

Seungjae Lee, Daejeon, KR;

Sangil Na, Daejeon, KR;

Keun Dong Lee, Daejeon, KR;

Sungkwan Je, Daejeon, KR;

Da-Un Jung, Daejeon, KR;

Weon Geun Oh, Daejeon, KR;

Young Ho Suh, Daejeon, KR;

Wookho Son, Daejeon, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/46 (2006.01); G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
G06K 9/4671 (2013.01); G06F 17/30247 (2013.01);
Abstract

A method for extracting features from an image for use in a computing device, the method comprising: producing Gaussian Scale Space (GSS) images in the type of a pyramid from the image inputted to the computing device; performing a Scale Normalized Laplacian Filtering on the GSS images; detecting interest points from the images that are subject to the Scale Normalized Laplacian Filtering; and extracting features of the image using the detected interest points.


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