The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 12, 2017
Filed:
Jun. 30, 2011
Stefan Richter, Jena, DE;
Enrico Geissler, Jena, DE;
Stefan Richter, Jena, DE;
Enrico Geissler, Jena, DE;
Carl Zeiss Microscopy GmbH, Jena, DE;
Abstract
The invention is directed to an optical scanning device with two scanning mirrors and with optical elements for imaging the two scanning mirrors one onto the other by means of an intermediate image. A control unit is provided for supplying drives which are coupled to the scanning mirrors with excitation voltages or excitation currents to initiate deflection angles ranging from zero to the maximum possible deflection angle for the two scanning mirrors. At least one of the scanning mirrors is designed for biaxial scanning, and the control unit is designed to vary the driving of the two scanning mirrors with respect to biaxial or uniaxial deflection of the beam bundle electively in quasistatic or resonant mode of operation. At least one of the two scanning mirrors is preferably designed as MEMS assembly.