The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 12, 2017
Filed:
Oct. 28, 2011
David Kaushansky, Belmont, MA (US);
Lloyd K. Frick, Pepperell, MA (US);
Stephen J. Bourassa, Tewksbury, MA (US);
David Vandervalk, Chelmsford, MA (US);
Michael Thomas Fluet, Litchfield, NH (US);
Michael Francis Mcgoldrick, North Reading, MA (US);
David Kaushansky, Belmont, MA (US);
Lloyd K. Frick, Pepperell, MA (US);
Stephen J. Bourassa, Tewksbury, MA (US);
David Vandervalk, Chelmsford, MA (US);
Michael Thomas Fluet, Litchfield, NH (US);
Michael Francis McGoldrick, North Reading, MA (US);
Teradyne, Inc., North Reading, MA (US);
Abstract
In general, a test instrument includes a first processing system that is programmable to run one or more test programs to test a device interfaced to the test instrument, and that is programmed to control operation of the test instrument, a second processing system that is dedicated to device testing, the second processing system being programmable to run one or more test programs to test the device, and programmable logic configured to act as an interface between the test instrument and the device, the programmable logic being configurable to perform one or more tests on the device. The first processing system and the second processing system are programmable to access the device via the programmable logic.