The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 12, 2017

Filed:

Apr. 14, 2014
Applicant:

Hitachi High-technologies Corporation, Tokyo, JP;

Inventors:

Toyoaki Tanoue, Tokyo, JP;

Masato Fukuda, Tokyo, JP;

Daisuke Akieda, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 30/24 (2006.01); G01N 30/32 (2006.01);
U.S. Cl.
CPC ...
G01N 30/24 (2013.01); G01N 30/32 (2013.01);
Abstract

An analysis method is achieved in which pressure variation resulting from sample injection or passage switching by an autosampler does not exert an influence on the control of a liquid transfer pump. The liquid chromatograph analysis method comprises the steps of: transferring two or more types of eluents while changing a mixing ratio between the eluents; adjusting an amount of the transferred liquid within a predetermined time in a passage for the eluent transferred; injecting a sample in the passage; supplying to a separation column the eluent into which the sample is injected; separating a target component in the sample; and detecting the target component thus separated. In this method, control is exercised so as to synchronize a liquid transfer cycle of the eluent with the sample injecting operation and to implement the sample injecting operation at a timing rather than the pressure obtaining time.


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