The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 12, 2017

Filed:

Dec. 07, 2009
Applicant:

Kazuhiro Narahara, Nagasaki, JP;

Inventor:

Kazuhiro Narahara, Nagasaki, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C30B 25/10 (2006.01); C23C 16/48 (2006.01); H01L 21/67 (2006.01); C23C 16/52 (2006.01); C23C 16/458 (2006.01); C30B 25/16 (2006.01); C30B 29/06 (2006.01);
U.S. Cl.
CPC ...
C23C 16/481 (2013.01); C23C 16/4583 (2013.01); C23C 16/52 (2013.01); C30B 25/10 (2013.01); C30B 25/16 (2013.01); C30B 29/06 (2013.01); H01L 21/67248 (2013.01);
Abstract

A method of manufacturing an epitaxial wafer in which an epitaxial layer is grown over a main surface of a silicon wafer placed substantially horizontally on a susceptor is provided. The method comprises: a growing step of the epitaxial layer; and a cooling step of cooling the epitaxial wafer having the epitaxial layer. The cooling step comprises: a wafer measurement step of measuring a temperature of the epitaxial wafer; a susceptor measurement step of measuring a temperature of the susceptor; and a control step of controlling a heater capable of heating at least the susceptor or the epitaxial wafer such that difference between a temperature of the epitaxial wafer and a temperature of the susceptor is within a predetermined range.


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