The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 05, 2017
Filed:
Jun. 24, 2015
Applicant:
Intel Ip Corporation, Santa Clara, CA (US);
Inventors:
Gaby Prechner, Rishon Lezion, IL;
Itai Steiner, Tel Aviv, IL;
Kobi Kopelman, Tel Aviv, IL;
Leor Banin, Petach Tikva, IL;
Assignee:
INTEL IP CORPORATION, Santa Clara, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 64/00 (2009.01); G01S 5/02 (2010.01); G01S 5/14 (2006.01); G01S 13/76 (2006.01); G01S 13/87 (2006.01); H04W 84/12 (2009.01);
U.S. Cl.
CPC ...
H04W 64/00 (2013.01); G01S 5/0236 (2013.01); G01S 5/14 (2013.01); G01S 13/767 (2013.01); G01S 13/876 (2013.01); H04W 84/12 (2013.01);
Abstract
Some demonstrative embodiments include apparatuses, devices, systems and methods of one-sided Round-Trip-Time (RTT) measurement. For example, an apparatus may include circuitry and logic configured to cause a mobile device to receive bias information of an Access-Point (AP); perform a one-sided round-trip-time (RTT) measurement with the AP; and estimate a range between the mobile device and the AP based on the one-sided RTT measurement and the bias information.