The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 05, 2017
Filed:
Dec. 03, 2014
Canon Kabushiki Kaisha, Tokyo, JP;
Hervé Soulard, Beacon Hill, AU;
Jun Liu, Dundas, AU;
Andrew R Coker, Macquarie Park, AU;
Abhijit Mandal, Krishnagar, IN;
CANON KABUSHIKI KAISHA, Tokyo, JP;
Abstract
A method of tessellating a parametric patch () of an object is disclosed. A boundary curve associated with the parametric patch () is vectorized according to a pre-determined flatness tolerance. A tessellation point associated with a first parametric value inside the parametric patch () is determined based on geometry of the parametric patch () and a tessellation step. A curve associated with the first parametric value is determined based on the geometry of the parametric patch () and the tessellation step. A color split point on the vectorized boundary curve is determined. The color split point is determined based on the vectorized boundary curve and the determined curve associated with the first parametric value. The parametric patch () is tessellated by joining the color split point and the tessellation point.