The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 05, 2017

Filed:

Oct. 14, 2016
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Stephen P. Glancy, Poughkeepsie, NY (US);

Jeremy R. Neaton, Fishkill, NY (US);

Anuwat Saetow, Austin, TX (US);

Jacob D. Sloat, Rochester, MN (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 16/04 (2006.01); G06F 11/14 (2006.01); G11C 29/52 (2006.01);
U.S. Cl.
CPC ...
G06F 11/142 (2013.01); G11C 29/52 (2013.01); G06F 2201/805 (2013.01);
Abstract

A method, system and memory controller are provided for implementing signal integrity fail recovery and mainline calibration for Dynamic Random Access Memory (DRAM). After identifying a failed DRAM, the DRAM is marked as bad and taken out of mainline operation. Characterization tests and periodic calibrations are run to evaluate optimal settings and to determine if the marked DRAM is recoverable. If recoverable, the marked DRAM chip is redeployed. If unrecoverable, error reporting is provided to the user.


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