The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 05, 2017
Filed:
May. 23, 2011
Takahiro Sasaki, Hitachinaka, JP;
Kenichi Takahashi, Naka, JP;
Hiroshi Ohga, Hitachiomiya, JP;
Tatsuya Fukugaki, Hitachinaka, JP;
Shigeru Yano, Hitachinaka, JP;
Kenichi Yasuzawa, Hitachinaka, JP;
Nozomi Hasegawa, Hitachinaka, JP;
Masaaki Hanawa, Hitachinaka, JP;
Takahiro Sasaki, Hitachinaka, JP;
Kenichi Takahashi, Naka, JP;
Hiroshi Ohga, Hitachiomiya, JP;
Tatsuya Fukugaki, Hitachinaka, JP;
Shigeru Yano, Hitachinaka, JP;
Kenichi Yasuzawa, Hitachinaka, JP;
Nozomi Hasegawa, Hitachinaka, JP;
Masaaki Hanawa, Hitachinaka, JP;
Hitachi High-Technologies Corporation, Tokyo, JP;
Abstract
A sample test automation system which is capable of reducing the workload of an operator and precisely carrying out necessary processes of each of samples without stagnation. In the sample test automation system, a sample trayon which a plurality of samplescan be installed is prepared, an identifier for distinguishing the sample trayis attached to the sample tray, a sample introducing unitis provided with an identifier reading apparatuswhich reads the identifier of the sample tray, and information about the samplesis switched based on the read identifier of the sample tray