The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 05, 2017
Filed:
Dec. 18, 2013
Korea Food Research Institute, Bundang-gu, Seongnam-si, Gyeonggi-do, KR;
Sung Wook Choi, Yongin-si, KR;
Hyun Jung Kim, Seoul, KR;
Na Ri Lee, Seoul, KR;
Hyun Joo Chang, Seoul, KR;
Gyeong Sik Ok, Osan-si, KR;
Korea Food Research Institute, Bundang-gu, Seongnam-, KR;
Abstract
A scanning module including first path shifting unit changing a path of an incident electromagnetic wave from a light source; a first driving unit adjusting the path of the electromagnetic wave by moving the first path shifting unit; and a Bessel beam generating unit making a Bessel beam on a portion of an object, using the electromagnetic wave with the path changed by the path shifting unit. A detection probe which includes a light source generating an electromagnetic wave; a path shifting unit changing a path of an electromagnetic wave from a light source; a Bessel beam generating unit making a Bessel beam on a portion of an object, using the electromagnetic wave with the path changed by the path shifting unit; a detecting unit detecting intensity of a wave from the object, and a housing accommodating the light source, path shifting unit, Bessel beam generating unit, and detecting unit.