The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 29, 2017

Filed:

Dec. 01, 2016
Applicant:

Nxp Usa, Inc., Austin, TX (US);

Inventors:

Zhou Fang, Suzhou, CN;

Song Huang, Suzhou, CN;

Chao Liang, Suzhou, CN;

Yifeng Liu, Suzhou, CN;

Wanggen Zhang, Suzhou, CN;

Assignee:

NXP USA, INC., Austin, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M 1/10 (2006.01); H03M 3/00 (2006.01); H03M 1/66 (2006.01);
U.S. Cl.
CPC ...
H03M 3/50 (2013.01); H03M 1/108 (2013.01); H03M 1/1071 (2013.01); H03M 1/66 (2013.01); H03M 3/30 (2013.01);
Abstract

A built-in-self-test (BIST) circuit is connected to a processor and a sigma-delta modulator (SDM) and includes an averaging circuit, a reference signal generator, and a comparator. The averaging circuit calculates an average of a sum of a set of bit signals of the SDM output signal over a period of time period, and generates an average SDM signal. The reference signal generator generates a reference SDM signal based on an SDM input signal. The comparator compares the voltage levels of the average SDM and reference SDM signals with a threshold value, and generates a test output signal based on the comparison.


Find Patent Forward Citations

Loading…