The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 29, 2017
Filed:
Jun. 28, 2016
Intel Corporation, Santa Clara, CA (US);
Mingjing Huang, San Francisco, CA (US);
Jacob E. Ben-Poorat, Oakland, CA (US);
Intel Corporation, Santa Clara, CA (US);
Abstract
Disclosed herein are devices and methods for a multiple contact probe. The multiple contact probe may include a first contact interface and a second contact interface. The first contact interface may be electrically isolated from the second contact interface. A plunger assembly may be slidably engaged between the first contact interface and the second contact interface. The plunger assembly may be slidable between an extended configuration and a retracted configuration along a longitudinal direction of the plunger assembly. The plunger assembly may include a first electrical contact and a second electrical contact. The first electrical contact may be in electrical contact with the first contact interface and the second electrical contact may be in electrical contact with the second contact interface. A bias element may be engaged with the plunger assembly, for instance, the bias element may be configured to bias the plunger assembly to the extended configuration.