The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 29, 2017

Filed:

Oct. 26, 2015
Applicant:

United Microelectronics Corp., Hsin-Chu, TW;

Inventors:

I-cheng Hu, Kaohsiung, TW;

Tien-I Wu, Taoyuan, TW;

Chun-Jen Chen, Tainan, TW;

Yu-Shu Lin, Pingtung County, TW;

Neng-Hui Yang, Hsinchu, TW;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 29/66 (2006.01); H01L 29/78 (2006.01); H01L 29/161 (2006.01); H01L 29/165 (2006.01); H01L 29/08 (2006.01); H01L 21/02 (2006.01);
U.S. Cl.
CPC ...
H01L 29/7848 (2013.01); H01L 29/0847 (2013.01); H01L 29/161 (2013.01); H01L 29/165 (2013.01); H01L 29/66628 (2013.01); H01L 29/66636 (2013.01); H01L 21/0243 (2013.01); H01L 21/0245 (2013.01); H01L 21/0262 (2013.01); H01L 21/02502 (2013.01); H01L 21/02532 (2013.01); H01L 21/02639 (2013.01);
Abstract

An epitaxial structure of semiconductor device includes a substrate, a recess, a first epitaxial layer, a second epitaxial layer, and a third epitaxial layer. The recess is formed in the substrate and disposed near a surface of the substrate, wherein the recess has a recess depth. The first epitaxial layer is disposed on surfaces of a sidewall and a bottom of the recess. The second epitaxial layer is disposed on the surface of the first epitaxial layer, wherein the Ge concentration of the second epitaxial layer is greater than the Ge concentration of the first epitaxial layer. The third epitaxial layer is disposed on the surface of the second epitaxial layer, wherein the Ge concentration of the third epitaxial layer is greater than the Ge concentration of the second epitaxial layer, and the depth of the third epitaxial layer is about ½ to about ¾ of the recess depth.


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