The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 22, 2017

Filed:

Nov. 01, 2016
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Kangguo Cheng, Schenectady, NY (US);

Lawrence A. Clevenger, Rhinebeck, NY (US);

Balasubramanian S. Pranatharthi Haran, Watervliet, NY (US);

John H. Zhang, Altamont, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/335 (2006.01); H01L 21/768 (2006.01); H01L 23/532 (2006.01); H01L 23/535 (2006.01);
U.S. Cl.
CPC ...
H01L 21/76849 (2013.01); H01L 21/76802 (2013.01); H01L 21/76847 (2013.01); H01L 23/535 (2013.01); H01L 23/53209 (2013.01);
Abstract

A method of fabricating features of a semiconductor device includes forming a contact over a substrate, the contact including a cobalt core and a liner layer arranged on sidewalls, wherein the contact includes a portion that is laterally surrounded by an interlevel dielectric (ILD); depositing another layer of ILD on the contact; etching a first opening in the ILD to expose a surface of the contact; removing the liner layer of the contact to expose a portion of the cobalt core; etching the ILD that laterally surrounds the contact to form a second opening beneath the first opening, the second opening having a width that is less than the first opening; depositing a liner on sidewalls of the first opening, the second opening, and directly on the cobalt core; and depositing a metal on the liner layer to form an interconnect structure.


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