The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 22, 2017

Filed:

Sep. 23, 2014
Applicant:

Eugene Technology Co., Ltd., Yongin-si, Gyeonggi-do, KR;

Inventors:

Hai-Won Kim, Icheon-si, KR;

Seok-Yun Kim, Yongin-si, KR;

Assignee:

EUGENE TECHNOLOGY CO., LTD., Yongin-si, Gyeonggi-do, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 29/30 (2006.01); H01L 21/28 (2006.01); C23C 16/40 (2006.01); C23C 16/455 (2006.01); H01L 29/423 (2006.01); H01L 29/51 (2006.01); H01L 29/66 (2006.01); H01L 29/792 (2006.01); H01L 21/02 (2006.01);
U.S. Cl.
CPC ...
H01L 21/28282 (2013.01); C23C 16/402 (2013.01); C23C 16/45536 (2013.01); H01L 21/0228 (2013.01); H01L 21/0234 (2013.01); H01L 21/02164 (2013.01); H01L 21/02274 (2013.01); H01L 21/02332 (2013.01); H01L 29/42364 (2013.01); H01L 29/518 (2013.01); H01L 29/66833 (2013.01); H01L 29/792 (2013.01); H01L 21/0214 (2013.01); H01L 21/0262 (2013.01); H01L 21/02532 (2013.01);
Abstract

Provided is a method of cyclically depositing a thin film including: performing an oxide depositing operation of repeatedly performing a deposition operation, a first purge operation, a reaction operation, and a second purge operation, wherein the deposition operation deposits silicon on a target by injecting a silicon precursor into a chamber into which the target is loaded, the first purge operation removes a non-reacted silicon precursor and a reacted byproduct from inside the chamber, the reaction operation supplies a first reaction source including oxygen into the chamber to form the deposited silicon as an oxide including silicon, and the second purge operation removes a non-reacted first reaction source and a reacted byproduct from the inside of the chamber; and performing a plasma processing operation of supplying plasma made of a second reaction source including nitrogen to the inside of the chamber to process the oxide including the silicon.


Find Patent Forward Citations

Loading…