The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 22, 2017
Filed:
Nov. 10, 2015
Applicant:
SK Hynix Memory Solutions Inc., San Jose, CA (US);
Inventors:
Naveen Kumar, San Jose, CA (US);
Frederick K. H. Lee, Mountain View, CA (US);
Christopher S. Tsang, Santa Clara, CA (US);
Lingqi Zeng, San Jose, CA (US);
Assignee:
SK hynix memory solutions Inc., San Jose, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11C 11/56 (2006.01); G11C 16/26 (2006.01); G11C 16/04 (2006.01); G11C 16/34 (2006.01); G11C 29/02 (2006.01);
U.S. Cl.
CPC ...
G11C 11/5642 (2013.01); G11C 16/0483 (2013.01); G11C 16/26 (2013.01); G11C 16/3427 (2013.01); G11C 29/021 (2013.01); G11C 29/028 (2013.01);
Abstract
An optimal read threshold estimation method includes determining a flip difference corresponding to an optimal step size Δ, estimating a first slope mat a first read point and a second slope mat a second read point, and obtaining an optimal read threshold (X) as the intersection of a first line with the first slope mand a second line with the second slope m.