The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 22, 2017

Filed:

Sep. 23, 2014
Applicant:

Picarro, Inc., Santa Clara, CA (US);

Inventors:

Chris W. Rella, Sunnyvale, CA (US);

Eric R. Crosson, Livermore, CA (US);

Michael R. Woelk, Livermore, CA (US);

Sze Meng Tan, Santa Clara, CA (US);

Yonggang He, Union City, CA (US);

David Steele, San Francisco, CA (US);

Assignee:

Picarro, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01M 3/04 (2006.01); G01N 33/00 (2006.01); G01M 3/20 (2006.01); G01M 3/38 (2006.01); G01N 21/01 (2006.01); G01N 21/3504 (2014.01); G01N 21/39 (2006.01); G01N 21/03 (2006.01);
U.S. Cl.
CPC ...
G01N 33/0009 (2013.01); G01M 3/20 (2013.01); G01M 3/38 (2013.01); G01N 21/01 (2013.01); G01N 21/3504 (2013.01); G01N 21/39 (2013.01); G01N 2021/0314 (2013.01); G01N 2201/025 (2013.01);
Abstract

Improved gas leak detection from moving platforms is provided. Automatic horizontal spatial scale analysis can be performed in order to distinguish a leak from background levels of the measured gas. Source identification can be provided by using isotopic ratios and/or chemical tracers to distinguish gas leaks from other sources of the measured gas. Multi-point measurements combined with spatial analysis of the multi-point measurement results can provide leak source distance estimates. Qualitative source identification is provided. These methods can be practiced individually or in any combination.


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