The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 22, 2017
Filed:
Sep. 06, 2013
Carl Zeiss X-ray Microscopy, Inc., Pleasanton, CA (US);
Michael Feser, Orinda, CA (US);
Srivatsan Seshadri, San Ramon, CA (US);
Carl Zeiss X-ray Microscopy, Inc., Pleasanton, CA (US);
Abstract
A correlative evaluation of a sample () using a combined x-ray computed tomography (CT) and x-ray fluorescence (XRF) system and the method for analyzing a sample () using x-ray CT and XRF is disclosed. The CT/XRF system () includes an x-ray CT subsystem () for acquisition of volume information and a confocal XRF subsystem () for characterization of elemental composition information. Geometrical calibration is carried out between the XRF subsystem () and the X-ray CT subsystem () such that a region of interest defined during X-ray CT acquisition can be retrieved by the XRF subsystem () for a subsequent XRF acquisition. The system () combines the sub-micrometer spatial resolution 3-D imaging capability of x-ray CT with the elemental composition analysis of confocal XRF to provide 3-D elemental composition analysis of a sample () with ppm level sensitivity. This is applicable to many scientific research and industrial applications, a prime example of which is the elemental identification of precious metal grains in crushed and ground ores and floatation tailings in the mining industry.