Embedded memory testing using back-to-back write/read operations

Abstract

In one embodiment, a BIST (built-in self-test) engine performs BIST testing of embedded memory in an integrated circuit device (e.g., an FPGA) via an (e.g., hard-wired, dedicated, low-latency) bus from the configuration bitstream engine. During BIST testing, data is written into the embedded memory at-speed, which may require the bitstream engine to produce a higher frequency than originally used for configuration. Between consecutive write operations, the BIST engine is capable of reading the previously written set of data from the embedded memory and comparing that read-back data with the corresponding original set of data to determine whether a BIST error has occurred. By performing back-to-back write/read-back operations faster than the configuration speed and using a dedicated W/RB bus, BIST testing can be optimally performed without false-positive-invoking delays and undesirable resource utilization.