The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 08, 2017

Filed:

Oct. 30, 2013
Applicant:

Maxim Integrated Products, Inc., San Jose, CA (US);

Inventors:

Hemant Desai, Gilbert, AZ (US);

Peter Harper, Gilroy, CA (US);

Demetre Kondylis, Saratoga, CA (US);

Assignee:

Hanking Electronics Ltd., Solon, OH (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01P 1/02 (2006.01); H01L 29/84 (2006.01); G01P 15/08 (2006.01); B81C 1/00 (2006.01);
U.S. Cl.
CPC ...
G01P 15/0802 (2013.01); B81C 1/0023 (2013.01); B81C 1/00269 (2013.01); G01P 1/023 (2013.01); B81C 2203/0118 (2013.01); G01P 2015/0862 (2013.01);
Abstract

The invention relates to sensors, and more particularly, a sensor device having accelerometer and gyroscope integrated into a low cost compact package. The device includes: MEMs wafer; and an ASIC wafer bonded to the MEMs wafer; a wafer-level-package redistribution layer (WLP RDL) formed on a surface of the ASIC wafer; and a ball grid array having a plurality of solder balls that electrically connect the package to a circuit board. The MEMs wafer includes the accelerometer and gyroscope, while the ASIC wafer includes two separate cavities corresponding to the accelerometer and gyroscope, respectively. The ASIC wafer includes electrical circuits/components to process the readout signals received from the accelerometer and gyroscope.


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