The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 01, 2017

Filed:

Mar. 13, 2015
Applicant:

Invensense, Inc., San Jose, CA (US);

Inventors:

Ge Gao, Fremont, CA (US);

William Kerry Keal, Santa Clara, CA (US);

James Lim, Saratoga, CA (US);

Assignee:

InvenSense, Inc., San Jose, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/27 (2006.01); G06F 11/22 (2006.01); G01C 25/00 (2006.01); G01L 27/00 (2006.01); G01P 21/00 (2006.01); G01R 35/00 (2006.01);
U.S. Cl.
CPC ...
G06F 11/27 (2013.01); G01C 25/00 (2013.01); G01L 27/002 (2013.01); G01P 21/00 (2013.01); G01R 35/005 (2013.01); G06F 11/2273 (2013.01);
Abstract

A method and system for providing a self-test configuration in a device is disclosed. The method and system comprise providing a self-test mechanism in a kernel space of a memory and enabling a hook in a user space of the memory, wherein the hook is in communication with the self-test mechanism. The method and system also include running the self-test driver and utilizing the results.


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