The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 01, 2017
Filed:
Mar. 31, 2015
Applicant:
Xcerra Corporation, Norwood, MA (US);
Inventors:
Wai-Kong Chen, Fremont, CA (US);
David Harris, San Jose, CA (US);
Assignee:
Xcerra Corporation, Norwood, MA (US);
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/26 (2014.01); G01R 31/28 (2006.01); G01R 31/319 (2006.01);
U.S. Cl.
CPC ...
G01R 31/2834 (2013.01); G01R 31/31926 (2013.01);
Abstract
An automated test platform for testing a first device under test includes N voltage sources for providing N different voltages. A cross matrix switching system is coupled to the N voltage sources, the cross matrix switch being configured to provide the N different voltages to M discrete test points within the first device under test, wherein M is larger than N. An N voltage measuring system is coupled to the first device under test, the N voltage measuring system being configured to measure the voltage potential present on the M discrete test points.