The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 25, 2017
Filed:
Aug. 18, 2016
Applicant:
Seagate Technology Llc, Cupertino, CA (US);
Inventors:
Michael Louis Rancour, Minnetonka, MN (US);
Brett Robert Herdendorf, Mound, MN (US);
Ronald Eldon Anderson, Lakeville, MN (US);
Assignee:
Seagate Technology LLC, Cupertino, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11B 7/00 (2006.01); G11B 20/18 (2006.01); G11B 23/00 (2006.01); G11B 33/00 (2006.01); G11B 15/00 (2006.01); G01R 31/02 (2006.01); G06F 11/00 (2006.01); G11B 25/04 (2006.01);
U.S. Cl.
CPC ...
G11B 20/1816 (2013.01); G01R 31/02 (2013.01); G06F 11/00 (2013.01); G11B 15/00 (2013.01); G11B 23/00 (2013.01); G11B 25/043 (2013.01); G11B 33/00 (2013.01);
Abstract
A test deck may be employed as part of a data storage component testing system. A test deck can consist of at least a bottom cover mating to a top cover to define an enclosed testing region configured to house a data storage medium, transducing head, and head suspension. The top cover may have an access port occupied by a door providing access to the enclosed testing region.