The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 25, 2017
Filed:
Feb. 25, 2013
The Board of Trustees of the University of Illinois, Urbana, IL (US);
S. Derin Babacan, Champaign, IL (US);
Mustafa A. H. Mir, Urbana, IL (US);
Gabriel Popescu, Champaign, IL (US);
Zhuo Wang, Urbana, IL (US);
The Board of Trustees of the University of Illinois, Urbana, IL (US);
Abstract
Methods and a computer program product for applying deconvolution to spatial light interference microscopy for resolution enhancement with respect to the diffraction limit in two and three dimensions. By exploiting the sparsity properties of the phase images, which is prominent in many biological imaging applications, and modeling of the image formation via complex fields, the very fine structures can be recovered which were blurred by the optics. The resolution improvement leads to higher accuracy in monitoring dynamic activity over time. Experiments with primary brain cells, i.e. neurons and glial cells, reveal new subdiffraction structures and motions. This new information can be used for studying vesicle transport in neurons, which may shed light on dynamic cell functioning. Finally, the method may flexibly incorporate a wide range of image models for different applications and can be utilized for all imaging modalities acquiring complex field images.