The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 25, 2017

Filed:

Oct. 06, 2015
Applicant:

Jeol Ltd., Tokyo, JP;

Inventor:

Kazushiro Yokouchi, Tokyo, JP;

Assignee:

JEOL Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01D 9/00 (2006.01); G01N 23/227 (2006.01); G01N 35/00 (2006.01);
U.S. Cl.
CPC ...
G01D 9/005 (2013.01); G01N 23/2273 (2013.01); G01N 23/2276 (2013.01); G01N 35/00722 (2013.01); G01N 2035/0091 (2013.01); G01N 2035/00891 (2013.01);
Abstract

An information processing device includes a storage sectionthat stores a history relating to the acquisition of measurement data, a history relating to an analysis position within an analyzer, and a history relating to a predetermined operation performed on a specimen using the analyzer as log information linked to time information, and a display control sectionthat performs a control process that displays these histories within a log display area on a display screenin time series based on the log information, the display control sectionperforming a control process that displays a measurement result image generated based on the measurement data on the display screen, and, when an operation input that selects one measurement result image, performing a control process that displays a history that corresponds to the measurement data used to generate the selected measurement result image.


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