The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 18, 2017

Filed:

Nov. 12, 2015
Applicant:

Taiwan Semiconductor Manufacturing Company, Ltd., Hsinchu, TW;

Inventors:

Ming-Chieh Huang, San Jose, CA (US);

Chan-Hong Chern, Palo Alto, CA (US);

Tsung-Ching Huang, Mountain View, CA (US);

Chih-Chang Lin, San Jose, CA (US);

Fu-Lung Hsueh, Kaohisung, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03K 5/14 (2014.01); H03H 11/26 (2006.01); H03K 5/133 (2014.01); H03K 5/00 (2006.01);
U.S. Cl.
CPC ...
H03K 5/14 (2013.01); H03K 5/133 (2013.01); H03K 2005/00019 (2013.01); H03K 2005/00071 (2013.01);
Abstract

A delay line circuit includes a plurality of delay circuits and a variable delay line circuit. The plurality of delay circuits receives an input signal and to generate a first output signal. The first output signal corresponds to a delayed input signal or an inverted input signal. The variable delay line circuit receives the first output signal. The variable delay line circuit includes an input end, an output end, a first and a second path. The input end is configured to receive the first output signal. The output end is configured to output a second output signal. The first path includes a first plurality of inverters and a first circuit. The second path includes a second plurality of inverters and a second circuit. The received first output signal is selectively transmitted through the first or second path based on a control signal received from a delay line controller.


Find Patent Forward Citations

Loading…