The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 18, 2017

Filed:

Oct. 28, 2014
Applicant:

Freescale Semiconductor, Inc., Austin, TX (US);

Inventors:

Mehul D. Shroff, Austin, TX (US);

Xavier Hours, Tournefeuille, FR;

Assignee:

NXP USA, INC., Austin, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01); H02M 3/158 (2006.01); G05F 3/08 (2006.01); H02M 3/156 (2006.01);
U.S. Cl.
CPC ...
H02M 3/158 (2013.01); G05F 3/08 (2013.01); G06F 17/5072 (2013.01); G06F 17/5036 (2013.01); G06F 2217/78 (2013.01); H02M 2003/1566 (2013.01);
Abstract

A design verification system simulates operation of an electronic device to identify one or more power characteristic vs. temperature (PC-T) curves for the electronic device. Each of the one or more PC-T curves indicates, for a particular reliability characteristic limit, a range of power characteristic values over a corresponding range of temperatures that are not expected to result in the reliability characteristic limit being exceeded. Based on the one or more PC-T curves, the design verification system sets a range of power characteristic limits, over a corresponding range of temperatures, for the electronic device. During operation, the electronic device employs a temperature sensor to measure an ambient or device temperature, and sets its power characteristic (voltage or current) according to the measured temperature and the power characteristic limits.


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