The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 18, 2017
Filed:
Apr. 01, 2015
Qualcomm Incorporated, San Diego, CA (US);
Ashutosh Anand, Gangalore, IN;
Shankarnarayan Bhat, Bangalore, IN;
Nikhil Sudhakaran, Bangalore, IN;
Praveen Raghuraman, Bangalore, IN;
Nishi Bhushan Singh, Bangalore, IN;
Anand Bhat, Bangalore, IN;
Abhinav Kothiala, Bangalore, IN;
Sanjay Muchini, Bangalore, IN;
Arun Balachandar, Bangalore, IN;
Devadatta Bhat, Bangalore, IN;
QUALCOMM Incorporated, San Diego, CA (US);
Abstract
Embodiments contained in the disclosure provide a method for memory built-in self-testing (MBIST). The method begins when a testing program is loaded, which may be from an MBIST controller. Once the testing program is loaded MBIST testing begins. During testing, memory failures are determined and written to a failure indicator register. The writing to the failure indicator register occurs in parallel with the ongoing MBIST testing. An apparatus is also provided. The apparatus includes a memory data read/write block, a memory register, a memory addressor, and a memory read/write controller. The apparatus communicates with the memories under test through a memory address and data bus.