The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 9709600 B1

PDF
Full Text
Expired
Date of Patent:
Jul. 18, 2017

Filed:

Aug. 14, 2014
Applicant:

Fei Company, Hillsboro, OR (US);

Inventors:

Paul Johannes L. Barends, Oisterwijk, NL;

Mathijs P. W. van den Boogaard, Boxtel, NL;

Philip Brundage, Portland, OR (US);

Assignee:

FEI Company, Hillsboro, OR (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 1/067 (2006.01); H01J 37/20 (2006.01);
U.S. Cl.
CPC ...
G01R 1/06705 (2013.01); H01J 37/20 (2013.01); H01J 2237/206 (2013.01); H01J 2237/208 (2013.01); H01J 2237/2008 (2013.01); H01J 2237/24564 (2013.01); H01J 2237/24592 (2013.01);
Abstract

A probe assembly can be connected and disconnected from its electrical harness within a vacuum chamber so that the probe assembly with the work piece mounted can be rotated and tilted without interference from a cable, and can then be reconnected without opening the vacuum chamber. Also described is a means of grounding a sample and probes when the probe assembly is disconnected from its electrical harness and a means of preventing damage to the probe mechanism and the probe itself by ensuring that the probes are not sticking up too far during operations.


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