The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 11, 2017
Filed:
Mar. 31, 2016
Sandisk Technologies Inc., Plano, TX (US);
Alon Eyal, Zichron Yaacov, IL;
Idan Alrod, Herzliya, IL;
Eran Sharon, Rishon Lezion, IL;
Ishai Ilani, Dolev, IL;
Mark Murin, Kfar Saba, IL;
David Rozman, Kiryat-Malakhi, IL;
Wei-Cheng Lien, San Jose, CA (US);
Deepanshu Dutta, Fremont, CA (US);
Changyuan Chen, San Ramon, CA (US);
SanDisk Technologies LLC, Plano, TX (US);
Abstract
Techniques are provided for non-volatile storage self-detecting that a heating event has occurred to the non-volatile storage. One example of the heating event is an Infrared (IR) reflow process. In one aspect, a block of memory cells in a memory device are put through a number of program/erase cycles. A group of the memory cells in the cycled block are programmed to a reference threshold voltage distribution. Some time may pass after programming the cycled block. The memory device self-detects that there has been a heating event in response to a shift in the reference Vdistribution being more than an allowed amount. The memory device may switch from a first programming mode to a second programming mode in response to detecting that the heating event has occurred.