The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 11, 2017

Filed:

Oct. 30, 2015
Applicant:

Synopsys, Inc., Mountain View, CA (US);

Inventors:

Christopher W. Schuermyer, Happy Valley, OR (US);

Karen Movsisyan, Abovyan, AM;

Assignee:

SYNOPSYS, INC., Mountain View, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/26 (2006.01); G06F 11/22 (2006.01);
U.S. Cl.
CPC ...
G06F 11/26 (2013.01); G06F 11/2268 (2013.01);
Abstract

Systems and techniques for identifying failure mechanisms based on a population of scan diagnostic reports is described. Given a population of scan diagnostic reports, a mixed membership model can be used for computing a topic distribution for each portion of each scan diagnostic report and a feature distribution for each topic. The failure mechanisms can be identified based on the topic distributions for the portions of the scan diagnostic reports and the feature distributions for the topics.


Find Patent Forward Citations

Schuermyer, Christopher. (2017). Identifying failure mechanisms based on a population of scan diagnostic reports (U.S. Patent No. 9703658). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9703658

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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