The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 11, 2017
Filed:
Dec. 16, 2011
Steven W. Stanton, Aloha, OR (US);
Edward C. Gee, Camas, WA (US);
Alfred K. Hillman, Jr., Banks, OR (US);
Steven W. Stanton, Aloha, OR (US);
Edward C. Gee, Camas, WA (US);
Alfred K. Hillman, Jr., Banks, OR (US);
Tektronix, Inc., Beaverton, OR (US);
Abstract
Disclosed is a test and measurement instrument having a multiple variable bandwidth frequency mask. The instrument includes an input processor for receiving an input signal and producing a digital signal, as well as a trigger signal generator for generating a trigger signal on the occurrence of a trigger event. A time to frequency converter converts a frame of digital data from the digital signal into a frequency spectrum having at least two frequency bins of dissimilar frequency widths. Each frequency bin has a power amplitude value. The trigger signal is generated when the power amplitude value of any of the at least two frequency bins violates an associated reference power level. In some cases the output may be shown as a density trace, and the trigger signal generated when any point of the density trace violates an associated density threshold.