The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 04, 2017

Filed:

Mar. 14, 2013
Applicant:

Frito-lay North America, Inc., Plano, TX (US);

Inventors:

Rick Wendell Bajema, Plano, TX (US);

Wilfred Marcellien Bourg, Jr., Melissa, TX (US);

Scott Fagan, Dallas, TX (US);

Sonchai Lange, Plano, TX (US);

Kerwin Bradley, Boise, ID (US);

David Ray Warren, Plano, TX (US);

Assignee:

Other;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04N 17/00 (2006.01); G01N 21/93 (2006.01); B07C 5/342 (2006.01); G01J 3/52 (2006.01);
U.S. Cl.
CPC ...
H04N 17/002 (2013.01); B07C 5/3422 (2013.01); G01J 3/524 (2013.01); G01N 21/93 (2013.01);
Abstract

A system and method for calibrating a dynamic digital imaging system for the detection of defects in a moving product stream. The system has an elevated platform above a conveying unit for receiving a reference color tile. The elevated platform allows for the passage of products to be inspected on the below conveying unit surface such that calibration and re-calibration processes during image capturing may be accomplished on a continuous basis without interruption of the product stream.


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