The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 04, 2017

Filed:

Sep. 16, 2015
Applicant:

Commissariat a L'energie Atomique ET Aux Energies Alternatives, Paris, FR;

Inventors:

Nicolas Posseme, Grenoble, FR;

Christian Arvet, Bernin, FR;

Sebastien Barnola, Villard Bonnot, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 27/12 (2006.01); H01L 29/66 (2006.01); H01L 21/265 (2006.01); H01L 21/311 (2006.01); H01L 29/06 (2006.01); H01L 29/78 (2006.01);
U.S. Cl.
CPC ...
H01L 29/66795 (2013.01); H01L 21/2658 (2013.01); H01L 21/31111 (2013.01); H01L 21/31116 (2013.01); H01L 29/0649 (2013.01); H01L 29/785 (2013.01);
Abstract

A method for etching a dielectric layer located on the surface of a three-dimensional structure formed on a face of a substrate oriented along a plane of a substrate, which includes a step of implanting ions so as to directionally create a top layer in the dielectric layer. Such top layer is thus not formed everywhere. Then, the layer in question is removed, except on the predefined zones, such as flanks of a transistor gate. A selective etching of the dielectric layer is executed relative to the material of the residual part of the top layer and relative to the material of the face of the substrate.


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