The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 04, 2017

Filed:

Aug. 30, 2016
Applicant:

Radiant Technologies, Inc., San Ramon, CA (US);

Inventors:

Joseph T. Evans, Jr., Albuquerque, NM (US);

Calvin B. Ward, Castro Valley, CA (US);

Assignee:

Radiant Technologies, Inc., Albuquerque, NM (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 11/22 (2006.01); G11C 11/406 (2006.01); G11C 11/419 (2006.01); G11C 11/24 (2006.01); G11C 11/56 (2006.01); G11C 11/4096 (2006.01); G11C 11/16 (2006.01);
U.S. Cl.
CPC ...
G11C 11/2275 (2013.01); G11C 11/221 (2013.01); G11C 11/2273 (2013.01); G11C 11/1673 (2013.01); G11C 11/22 (2013.01); G11C 11/4096 (2013.01); G11C 11/419 (2013.01); G11C 11/5642 (2013.01); G11C 11/5657 (2013.01);
Abstract

A ferroelectric memory and a method for operating a ferroelectric memory are disclosed. The ferroelectric memory includes a ferroelectric memory cell having a ferroelectric capacitor characterized by a maximum remanent charge, Q. A write circuit receives a data value having more than two states for storage in the ferroelectric capacitor. The write circuit measures Qfor the ferroelectric capacitor, determines a charge that is a fraction of the measured Qto be stored in the ferroelectric capacitor, the fraction being determined by the data value. The write circuit causes a charge equal to the fraction times Qto be stored in the ferroelectric capacitor. A read circuit determines a value stored in the ferroelectric capacitor by measuring a charge stored in the ferroelectric capacitor, measuring Qfor the ferroelectric capacitor, and determining the data value from the measured charge and the measured Q.


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