The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 04, 2017

Filed:

Jan. 28, 2016
Applicant:

Carl Zeiss Microscopy Gmbh, Jena, DE;

Inventor:

Thomas Nobis, Jena, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 21/00 (2006.01); G02B 21/02 (2006.01); G02B 21/33 (2006.01);
U.S. Cl.
CPC ...
G02B 21/02 (2013.01); G02B 21/33 (2013.01);
Abstract

A plan apochromat corrected microscope objective including multiple subsystems with optical components and/or component groups, wherein an optical component or a component group can move axially in the interior of the microscope objective. The axially movable component or the component group includes a concave-convex lens or lens group oriented toward the object plane, with a form factor of: wherein X is the form factor, cis the curvature of the surface oriented in the direction of the object plane, and cis the curvature of the surface oriented in the direction of the image plane, of the axially movable lens or lens group, X lying within a range from −8<X<−1.


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