The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 27, 2017
Filed:
Apr. 04, 2012
Applicants:
Horst Wolff, Siegenburg, DE;
Daniel Svejdar, Kirchdorf, DE;
Markus Eichinger, Tuerkenfeld, DE;
Inventors:
Assignee:
Carl Zeiss Microscopy GmbH, Jena, DE;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 21/36 (2006.01); G02B 21/00 (2006.01); G02B 21/24 (2006.01);
U.S. Cl.
CPC ...
G02B 21/365 (2013.01); G02B 21/006 (2013.01); G02B 21/244 (2013.01);
Abstract
A method for defining a z-range in a sample in which a z-stack of the sample is to be recorded by means of a microscope is provided, wherein the z-range is defined automatically on the basis of a z-value situated in the sample and taking at least one predetermined parameter into account.
Wolff, Horst. (2017). Method and apparatus for defining a z-range in a sample, in which a z-stack of the sample is to be recorded by means of a microscope (U.S. Patent No. 9690087). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9690087
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