The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 27, 2017
Filed:
Sep. 07, 2012
Nobuyoshi Komai, Tokyo, JP;
Hiroaki Fukushima, Tokyo, JP;
Yuichi Hirakawa, Tokyo, JP;
Hiroyuki Ohyama, Tokyo, JP;
Takeshi Miyazawa, Tokyo, JP;
Hiroaki Yoshida, Tokyo, JP;
Nobuyoshi Komai, Tokyo, JP;
Hiroaki Fukushima, Tokyo, JP;
Yuichi Hirakawa, Tokyo, JP;
Hiroyuki Ohyama, Tokyo, JP;
Takeshi Miyazawa, Tokyo, JP;
Hiroaki Yoshida, Tokyo, JP;
MITSUBISHI HITACHI POWER SYSTEMS, LTD., Kanagawa, JP;
Abstract
A first measured value of a specific physical quantity at a target portion is correlated with a damage evaluation index to calculate a damage degree corresponding to the first measured value. The specific physical quantity is measured at least once at a position corresponding to the first measurement position in another time period having a different usage elapsed time from that of the first measurement, and these second and subsequent measured values are correlated with damage degrees calculated based on temporal changes corresponding to the second and subsequent measurements. A new damage evaluation index is approximately calculated based on a relationship between the first, second, and subsequent measured values and the damage degrees corresponding to the first, second, and subsequent measured values.