The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 27, 2017
Filed:
May. 26, 2015
Applicant:
Mitutoyo Corporation, Kawasaki-shi, Kanagawa, JP;
Inventors:
Yuichi Nagataki, Kawasaki, JP;
Kentaro Nemoto, Kawasaki, JP;
Assignee:
MITUTOYO CORPORATION, Kawasaki, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/03 (2006.01); G01B 5/012 (2006.01); G01B 11/00 (2006.01); G01B 21/04 (2006.01); G01B 11/245 (2006.01);
U.S. Cl.
CPC ...
G01B 11/007 (2013.01); G01B 5/012 (2013.01); G01B 11/245 (2013.01); G01B 21/047 (2013.01);
Abstract
A multi-joint arm type measurement apparatus includes a plurality of probes mounted at a tip of a multi-joint mechanism, and a probe rotation holding mechanism configured to rotatably hold the other probe around one probe and to fix a rotating position of the other probe at a plurality of positions.
Quick Actions:
Nagataki, Yuichi. (2017). Multi-joint arm type measurement apparatus (U.S. Patent No. 9689663). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9689663
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile