The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 20, 2017

Filed:

Feb. 26, 2016
Applicant:

Toyoda Gosei Co., Ltd., Kiyosu-shi, JP;

Inventors:

Tsutomu Ina, Kiyosu, JP;

Tohru Oka, Kiyosu, JP;

Nariaki Tanaka, Kiyosu, JP;

Assignee:

TOYODA GOSEI CO., LTD., Kiyosu-Shi, Aichi-Ken, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/3213 (2006.01); H01L 29/45 (2006.01);
U.S. Cl.
CPC ...
H01L 21/32135 (2013.01); H01L 29/45 (2013.01);
Abstract

An object is to avoid an increase in contact resistance of an ohmic electrode by etching in a semiconductor device. There is provided a method of manufacturing a semiconductor device. The method of manufacturing comprises forming a semiconductor layer; forming an ohmic electrode by stacking a plurality of metal layers, on the semiconductor layer; forming another metal layer that is mainly made of another metal different from a material of an outermost layer among the plurality of metal layers, on the ohmic electrode; removing the another metal layer from top of the ohmic electrode by etching; and processing the ohmic electrode by heat treatment, subsequent to the etching.


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