The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 20, 2017
Filed:
Jan. 12, 2016
Mentor Graphics Corporation, Wilsonville, OR (US);
Jeremy Rutledge Levitt, San Jose, CA (US);
Christophe Gauthron, Mountain View, CA (US);
Chian-Min Richard Ho, Palo Alto, CA (US);
Ping Fai Yeung, San Jose, CA (US);
Kalyana C. Mulam, San Jose, CA (US);
Ramesh Sathianathan, Sunnyvale, CA (US);
Mentor Graphics Corporation, Wilsonville, OR (US);
Abstract
The amount of analysis performed in determining the validity of a property of a digital circuit is measured concurrent with performance of the analysis, and provided as an output when a true/false answer cannot be provided e.g. when stopped due to resource constraints. In some embodiments, a measure of value N indicates that a given property that is being checked will not be violated within a distance N from an initial state from which the analysis started. Therefore, in such embodiments, a measure of value N indicates that the analysis has implicitly or explicitly covered every possible excursion of length N from the initial state, and formally proved that no counter-example is possible within this length N.